Main Articles Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience

Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience

Jian Min Zuo, John C.H. Spence (auth.)

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Date:

2017

Publisher:

Springer

Pages:

729

DOI:

10.1007/978-1-4939-6607-3